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IGBT串聯用的有源電壓控制技術

作者: 時間:2012-05-14 來源:網絡 收藏

5 結論

通過以上實驗結果和分析,表明了是實現可靠的一種良好的方案。另一方面,在較高工作頻率下,采用低耐壓器件比采用單只高耐壓器件具有多種好處,包括低損耗、低成本、高冗余度等。考慮到在目前的條件下,單個器件的耐壓值再繼續(xù)提高難度很大,所以能夠實現器件可靠的有緣具有廣泛的應用空間。

20120509095514487.jpg

[附錄]

Ps即Pswitching,是單個IGBT的開關損耗:Pswitching=( Eon+ Eoff)*f

Pc即Pconduction,是單個IGBT的導通損耗:

Pconduction=VCE,on*Ic*D

其中D為占空比,設定為50%,則平均的Pconduction應為:

Pconduction=VCE,on*Ic*0.5

Pts即Ptotal,single,是單個IGBT的總功率損耗:Ptotal=Pswitching+ Pconduction

Pt即Ptotal,是串、并聯后每個方案中IGBT的

總功率損耗:

Ptotal=Ptotal,single*N

其中N是串、并聯個數。

參考文獻

1. Letor, R. Series connection of MOSFET, Bipolar and IGBT devices. SGS-Thomson Designers Guide to Power Products 1992.

2. K. Okamura, Y.W., K. Yokokura and I. Ohshima, High repetition rated semiconductor switch for excimer laser, in Proc. 19th IEEE Power Modulator Symp. . 1990: San Diego, CA. p. 407-410.

3. Beom-Seok, S., L. Toeck-Kie, and H. Dong-Seok. Synchronization on the points of turn-off time of series-connected power semiconductor devices using Miller effect. in Industrial Electronics, Control, Instrumentation, and Automation, 1992. Power Electronics and Motion Control., Proceedings of the 1992 International Conference on. 1992.

4. Gerster, C., P. Hofer, and N. Karrer. Gate-control strategies for snubberless operation of series connected IGBTs. in Power Electronics Specialists Conference, 1996. PESC '96 Record., 27th Annual IEEE. 1996.

5. Palmer, P.R. and A.N. Githiari, The series connection of IGBTs with active voltage sharing. Power Electronics, IEEE Transactions on, 1997. 12(4): p. 637-644.

6. Palmer, P.R., A.N. Githiari, and R.J. Leedham. Some scaling issues in the active voltage control of IGBT modules for high power applications. in Power Electronics Specialists Conference, 1997. PESC '97 Record., 28th Annual IEEE. 1997.

7. Githiari, A.N. and P.R. Palmer, Analysis of IGBT modules connected in series. Circuits, Devices and Systems, IEE Proceedings, 1998. 145(5): p. 354-360.


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